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Knowledge Base Articles

Single Event Upset (SEU) Cross Sectioning and Number of Gates for S25FL064L – KBA222108

chaitanyav_41
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Single Event Upset (SEU) Cross Sectioning and Number of Gates for S25FL064L – KBA222108

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Translation - Japanese: S25FL064Lのシングル イベント アップセット(SEU)断面とゲート数 - KBA222108 - Community Translated (JA)

Question:

What are Single Event Upset (SEU) cross sectioning and number of gates for the S25FL064L Serial NOR product?

Answer:

Single Event Upset (SEU) cross sectioning of S25FL064L family has a neutron bit cross section of 3.89E-20 cm2 per bit; the number of gates is on the order of 1e10.

Refer to JEDEC specifications at https://www.jedec.org/standards-documents/dictionary/terms/single-event-upset-seu-cross-section

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‎Dec 18, 2017 10:41 PM
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