2 Replies Latest reply on May 4, 2020 6:52 AM by ToAz_4396196

    SER characteristics for S70GL02GT

    ToAz_4396196

      What is the Soft Error Rate (SER) for the S70GL02GT?  Also, is this device susceptible to Single Event Latchup (SEL)?

        • 1. Re: SER characteristics for S70GL02GT
          ApurvaS_36

          Hi Tommy,

           

          Please find SER and SEL information below -

           

          Accelerated Alpha Particles

          Process Technology

          Product Family

          SER (FIT/Mb)

          SEL (FIT/Dev)

          SBU

          MCU

          45nm MirrorBit NOR

          Flash w/o ECC

          < 0.7

          < 0.07

          N/A

          Flash w/ ECC

          < 0.007

          < 7e-4

          N/A

           

          Accelerated Neutrons/Protons

          Process Technology

          Product Family

          SER (FIT/Mb)

          SEL (FIT/Dev)

          SBU

          MCU

          45nm MirrorBit NOR

          Flash w/o ECC

          < 0.7

          < 0.07

          < 10

          Flash w/ ECC

          < 0.007

          < 7e-4

          < 10

           

           

          Regards,

          Apurva

          • 2. Re: SER characteristics for S70GL02GT
            ToAz_4396196

            Thank you for the information Apurva.

             

            Would you be able to provide more details on the accelerated testing?  Is there a test report available?  In particular, for the SEL rate, I am looking for the number of devices tested, the total fluence applied during testing, and the number of latch up events observed during the accelerated testing.

             

            Thank you.