I am looking for the Single Event Upset cross section for the S29GL512T (or the SEU cross section for the family). Also, I would like to know if the device is susceptible to Single Event Latchup. If so, what is the latchup rate?
The NOR Flash S29GL512T devices are soft error immune. With ECC, no failure was observed.
The low occurrence of the SEL events were observed during test and FIT rate is below < 2.83 FIT/Device.