What is the Single Event Upset cross section and Single Event Latchup rate for S29GL512T?

[ToAz_4396196]

I am looking for the Single Event Upset cross section for the S29GL512T (or the SEU cross section for the family).  Also, I would like to know if the device is susceptible to  Single Event Latchup.  If so, what is the latchup rate?

[BushraH_91 · Accepted solution]

Hello Tommy,

The NOR Flash S29GL512T devices are soft error immune. With ECC, no failure was observed.

The low occurrence of the SEL events were observed during test and FIT rate is below < 2.83 FIT/Device.

Thank you

Regards,

Bushra