I'm currently developing a bare-metal driver for the S34ML01G2 NAND chip.
In this driver I'm managing the bad blocks and filling a DBBT (Bad Block Table).
So, I need a way to intentionally create a bad block in the NAND chip to make sure that my
bad block management function is working properly.
If there's no such way available, what do you suggest to be able to test the functionality of bad block detection?
Please find our KBA about bad block management in our NAND devices at following link: Marking and Recognizing Bad Blocks in NAND Flash - KBA219305 . I hope it is useful to you.
Thanks and Regards,