1 Reply Latest reply on Dec 19, 2018 2:03 AM by SudheeshK_26

    [SLC NAND] How to intentionally producing bad block for testing?



      I'm currently developing a bare-metal driver for the S34ML01G2 NAND chip.

      In this driver I'm managing the bad blocks and filling a DBBT (Bad Block Table).


      So, I need a way to intentionally create a bad block in the NAND chip to make sure that my

      bad block management function is working properly.


      If there's no such way available, what do you suggest to be able to test the functionality of bad block detection?