I found the source of incorrect data shown in whole area of CY14B116L.
The incorrect data is the test pattern ("0001 0203 0405 0607 .....") for memory test, write, read and check operation, of CY14B116L itself.
After memory test and power off, test pattern is stored in nonvolatile area of CY14B116L.
Maybe the reason of showing the incorrect data in CY14B116L is to transfer nonvolatile information into SRAM of CY14B116L.
I suppose that during normal operation , in CY14B116L, RECALL operation is initiated abnormally.
So data in nonvolatile information("0001 0203 0405 0607 0809 .....") is transferred into the SRAM of CY14B116L.
In CY14B116L, RECALL cycle must be executed by the power-on or software address sequence.
In datasheet, RECALL is initiated when Vcc again exceeds the Vswitch on power-up.
Now we are debugging why RECALL operation is initiated abnormally during the normal operation.