SER characteristics for S70GL02GT

[ToAz_4396196]

What is the Soft Error Rate (SER) for the S70GL02GT?  Also, is this device susceptible to Single Event Latchup (SEL)?

[Apurva_S · Accepted solution]

Hi Tommy,

Please find SER and SEL information below -

Accelerated Alpha Particles

Process Technology	Product Family	SER (FIT/Mb)		SEL (FIT/Dev)
		SBU	MCU
45nm MirrorBit NOR	Flash w/o ECC	< 0.7	< 0.07	N/A
	Flash w/ ECC	< 0.007	< 7e-4	N/A

Accelerated Neutrons/Protons

Process Technology	Product Family	SER (FIT/Mb)		SEL (FIT/Dev)
		SBU	MCU
45nm MirrorBit NOR	Flash w/o ECC	< 0.7	< 0.07	< 10
	Flash w/ ECC	< 0.007	< 7e-4	< 10

Regards,

Apurva

[ToAz_4396196]

Thank you for the information Apurva.

Would you be able to provide more details on the accelerated testing?  Is there a test report available?  In particular, for the SEL rate, I am looking for the number of devices tested, the total fluence applied during testing, and the number of latch up events observed during the accelerated testing.

Thank you.