Single Event Upset (SEU) Cross Sectioning and Number of Gates for S25FL064L – KBA222108
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Dec 18, 2017
10:41 PM
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Dec 18, 2017
10:41 PM
Version: **
Translation - Japanese: S25FL064Lのシングル イベント アップセット(SEU)断面とゲート数 - KBA222108 - Community Translated (JA)
Question:
What are Single Event Upset (SEU) cross sectioning and number of gates for the S25FL064L Serial NOR product?
Answer:
Single Event Upset (SEU) cross sectioning of S25FL064L family has a neutron bit cross section of 3.89E-20 cm2 per bit; the number of gates is on the order of 1e10.
Refer to JEDEC specifications at https://www.jedec.org/standards-documents/dictionary/terms/single-event-upset-seu-cross-section
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