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Single Event Upset Cross-Section and Single Event Latchup Rate for S29GL512T – KBA228164

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Single Event Upset Cross-Section and Single Event Latchup Rate for S29GL512T – KBA228164

Author: BushraH_91           Version: **

Translation - Japanese: Cypress S29GL512Tのシングルアップセット・クロスセクションとシングルイベントラッチアップの発生率について - KBA228164 - Community Translated (JA)

S29GL512T NOR Flash devices are immune to soft errors. With ECC, no failure has been observed.

Low occurrence of the Single Event Latchup events was observed during test; FIT rate is below < 2.83 FIT/device.

                                                                                    Single Event Latchup


Mode

Average SEL FIT Rate [FIT/Dev]

VT - Condition

CY Specs Target FIT Rate [FIT/Dev]

Remark

GL512T NOR Flash

<2.83

105C, 3.6V

10

PASSED

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Revision #:
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Last update:
‎Aug 23, 2019 03:43 AM
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