Single Event Upset Cross-Section and Single Event Latchup Rate for S29GL512T – KBA228164
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Aug 23, 2019
03:43 AM
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Aug 23, 2019
03:43 AM
Author: BushraH_91 Version: **
Translation - Japanese: Cypress S29GL512Tのシングルアップセット・クロスセクションとシングルイベントラッチアップの発生率について - KBA228164 - Community Translated (JA)
S29GL512T NOR Flash devices are immune to soft errors. With ECC, no failure has been observed.
Low occurrence of the Single Event Latchup events was observed during test; FIT rate is below < 2.83 FIT/device.
Single Event Latchup
Mode | Average SEL FIT Rate [FIT/Dev] | VT - Condition | CY Specs Target FIT Rate [FIT/Dev] | Remark |
GL512T NOR Flash | <2.83 | 105C, 3.6V | 10 | PASSED |
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