Migrating to S29GL01GT from S29GL01GP

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kara_4031341
Level 1
Level 1

Hai,

Recently We had migrated from S29GL01GP (SPANSION) Flash chip to S29GLO1GT (CYPRESS) Flash chip. We need to know whether we can use the same driver support which we had in S29GL01GP for S29GLO1GT or we need to do any modifications for its efficient working?

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Apurva_S
Moderator
Moderator
Moderator
100 likes received 500 replies posted 250 solutions authored

Hi,

Thank you for contacting Cypress Community.

Here is a link (https://www.cypress.com/file/198206/download) to the document that helps is migrating from GL-P to GL-S/GL-T devices. It outlines the differences and potential issues when migrating. It also discusses affected device features, timing parameters as well as packages.

Please let me know if you have any further queries in this regard.

Thanks and Regards,

Apurva

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5 Replies
Apurva_S
Moderator
Moderator
Moderator
100 likes received 500 replies posted 250 solutions authored

Hi,

Thank you for contacting Cypress Community.

Here is a link (https://www.cypress.com/file/198206/download) to the document that helps is migrating from GL-P to GL-S/GL-T devices. It outlines the differences and potential issues when migrating. It also discusses affected device features, timing parameters as well as packages.

Please let me know if you have any further queries in this regard.

Thanks and Regards,

Apurva

hai,

I have referred the document which you had mentioned before. And we need to know some additional information about the chip.

Can you tell us whether S29GL01GT11  is a single die or dual die?

We are able to do erase and program flash if the Continuity Check operation is performed before erasing operation. But the continuity check status result shows 'Zero' which means the 'Continuity Check Pattern not detected'

Is there any dependency to invoke a continuity check before performing erase and program operation. And also why continuity check is failing when able to program and erase flash.

Please clarify on this.

Thanks & Regards,

Kartik

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Hi Kartik,

S29GL01GT is a single die chip.

Regarding continuity check failure, could you please provide your pseudo code which explains flash operation steps followed for testing.

Regards,

Apurva

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Hi Apurva,

We had just used the following routine in our driver code to implement the Continuity Check operation and it failed.

/*

      out_be32((flash_ptr + 0x555), 0x71717171);

        out_be32((flash_ptr + 0x555), 0x70707070);

        printk(" flash check 1 %x",in_be32(flash_ptr + 0x555));

        out_be32((flash_ptr + 0x2AAAA55), 0xff00ff00);

        out_be32((flash_ptr + 0x15555AA), 0x00ff00ff);

        out_be32((flash_ptr + 0x555), 0x70707070);

        printk(" flash check 2  %x",in_be32(flash_ptr + 0x555));

*/

Regards,

Kartik

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Hi Kartik,

From the 2nd line of pseudo code, it looks like the device is in x16 mode by BYTE# pin control.

How does API out_be32(address, 32bit_data) deliver 32bit_data to flash memory via x16 width data bus? Does the API ignore upper 16-bit data, or deliver upper/lower 16-bit wide data two times?

Regards,

Apurva

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