Single Event Upset (SEU) Cross Sectioning and Number of Gates for S25FL064L – KBA222108

Version 2

    Version: **


    Translation - Japanese: S25FL064Lのシングル イベント アップセット(SEU)断面とゲート数 - KBA222108 - Community Translated (JA)



    What are Single Event Upset (SEU) cross sectioning and number of gates for the S25FL064L Serial NOR product?



    Single Event Upset (SEU) cross sectioning of S25FL064L family has a neutron bit cross section of 3.89E-20 cm2 per bit; the number of gates is on the order of 1e10.


    Refer to JEDEC specifications at