Single Event Upset (SEU) Cross Sectioning and Number of Gates for S25FL064L – KBA222108

Version 2

    Version: **

     

    Translation - Japanese: S25FL064Lのシングル イベント アップセット(SEU)断面とゲート数 - KBA222108 - Community Translated (JA)

     

    Question:

    What are Single Event Upset (SEU) cross sectioning and number of gates for the S25FL064L Serial NOR product?

     

    Answer:

    Single Event Upset (SEU) cross sectioning of S25FL064L family has a neutron bit cross section of 3.89E-20 cm2 per bit; the number of gates is on the order of 1e10.

     

    Refer to JEDEC specifications at https://www.jedec.org/standards-documents/dictionary/terms/single-event-upset-seu-cross-section